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Targets and backgrounds X : characterization and representation : 12-13 April 2004, Orlando, Florida, USA. pp.87-105, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Layered superconductors : fabrication, properties, and applications : symposium held April 27-May 1, 1992, in San Francisco, California, U.S.A.. pp.79-84, 1992. Pittsburgh, Pa.. Materials Research Society
Carlos, W. E. ; Moore, W. J. ; Siebenman, P..G. ; Freitas Jr., J. A. ; Kaplan, R. ; Bishop, S. G. ; Nordquist Jr., P. E. R. ; Kong, M. ; Davis, R. F.
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Novel refractory semiconductors : symposium held April 21-23, 1987, Anaheim, California, U.S.A.. pp.253-258, 1987. Pittsburgh, Penn.. Materials Research Society
Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A.. pp.107-110, 1992. Pittsburgh, Pa.. Materials Research Society
Wang, Y. J. ; Ng, H. K. ; Kaplan, R. ; Doverspike, K. ; Gaskill, D. K. ; Ikedo, T. ; Amano, H. ; Akasaki, I.
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Gallium nitride and related materials : the First International Symposium on Gallium Nitride and Related Materials held November 27-December 1, 1995, Boston, Massachusetts, U.S.A.. pp.697-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Fink, C. E. ; Moulton, J. R. Jr. ; Ortalano, M. ; Speer, R. ; Kaplan, R. ; Helmsen, J. ; Haren, R. ; Sawtelle, S. C.
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Targets and backgrounds XI : characterization and representation : 28-29 March 2005, Orlando, Florida, USA. pp.224-239, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering