Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA. pp.586913-586914, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Choi, Y.-W. ; Kim, E. D. ; Kang, M.-S. ; Jeong, S.-K. ; Yang, S. ; Kim, J. ; Kim, E.-E. ; Park, S.-D. ; Yang, H.-S. ; Afiq bin Ismail, A. M. ; Arshad, A. S.
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Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA. pp.588205-588205, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000. pp.199-208, 2000. Pennington, N.J.. Electrochemical Society
Airborne reconnaissance XXVI : 10-11July 2002, Seattle, Washington, USA. pp.58-65, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering