1.

Conference Proceedings
Conference Proceedings
1. Ab Initio Analysis of Point Defects in Plane-Stressed Si or Ge Crystals
K. Sueoka ; P. Spiewak ; J. Vanhellemont
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes 7.  pp.375-391,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(3)
2.

Conference Proceedings
Conference Proceedings
2. Density Functional Theory Analysis on Behavior of Metal Impurities in Ge (100) / Si (100)
T. Maeta ; K. Sueoka
Pub. info.: Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan.  pp.243-246,  2012.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 725
3.

Conference Proceedings
Conference Proceedings
3. Oxygen Precipitation in Lightly and Heavily Doped Czochralski Silicon
K. Sueoka
Pub. info.: High purity silicon 9.  pp.71-88,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(4)
4.

Conference Proceedings
Conference Proceedings
4. Defect Formation Behaviors in Heavily Doped Czochralski Silicon
W. Sugimura ; T. Ono ; S. Umeno ; M. Hourai ; K. Sueoka
Pub. info.: Silicon materials science and technology X.  pp.95-108,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)
5.

Conference Proceedings
Conference Proceedings
5. First Principles Calculation for Cu Gettering by Dopant or Dopant-Vacancy Complex in Silicon Crystal
K. Sueoka ; S. Ohara ; S. Shiba ; S. Fukutani
Pub. info.: Silicon materials science and technology X.  pp.261-274,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)
6.

Conference Proceedings
Conference Proceedings
6. Ab-initio Simulation of Formation and Diffusion Energies of Intrinsic Point Defects in Ge
P. Spiewak ; J. Vanhellemont ; K. Sueoka ; K. Kurzydlowski ; I. Romandic
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.659-667,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)