W. Schmidl ; K. Smith ; C. Soares ; C. Steagall ; C. G. Shaw
Pub. info.:
Optical system contamination : effects, measurements, and control 2008 : 13-14 August 2008, San Diego, California, USA. pp.70690E-1-70690E-11, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering