Silicon Carbide and Related Materials 2010 : Selected, peer reviewed papers from the 8th European Conference on Silicon Carbide and Related Materials (ECSCRM 2010), held in Oslo (Sundvolden Conference Centre), Norway, August 29th - September 2nd. pp.820-823, 2011. Aedermannsdorf, Switzerland. Trans Tech Publications
Integrated circuit metrology, inspection, and process control IX : 20-22 February 1995, Santa Clara, California. pp.144-157, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing 2007 : 30 January-1 February 2007, San Jose, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Visual communications and image processing 2008 : 29-31 January 2008, San Jose, California, USA. 2 pp.682221-1-682221-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
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