K. Kashima ; A. Fukuyama ; Y. Nakano ; M. Inagaki ; H. Suzuki
Pub. info.:
Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan. pp.93-96, 2012. Aedermannsdorf, Switzerland. Trans Tech Publications