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28 results

Conference Proceedings

1. New approach for testing of aspherical micro-optics with high numerical aperture

Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O.

Pub. info.:	Optical manufacturing and testing IV : 31 July-2 August 2001, San Diego, USA. pp.345-355, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4451

Conference Proceedings

2. Influence of depolarization effects in interferometric measurement methods

Menn,P. ; Kolenovic,E. ; Osten,W. ; Juptner,W.P.O.

Pub. info.:	Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany. pp.50-60, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4398

Conference Proceedings

3. Features of the subjective speckle field and their use for noise-immune unwrapping

Falldorf,C. ; Osten,W. ; Elandaloussi,F. ; Kolenovic,E. ; Juptner,W.P.O.

Pub. info.:	Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany. pp.238-246, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4398

Conference Proceedings

4. Application of digital holographic microscopy for inspection of micro-optical components

Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O.

Pub. info.:	Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June 2001 Munch, Germany. pp.189-198, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4398

Conference Proceedings

5. Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation

Seebacher,S. ; Osten,W. ; Juptner,W.P.O. ; Veiko,V.P. ; Voznessenski,N.B.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan. pp.312-322, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3740

Conference Proceedings

6. Particle size and position measurement with digital holography

Adams,M. ; Kreis,T.M. ; Juptner,W.P.O.

Pub. info.:	Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG. pp.234-240, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3098

Conference Proceedings

7. Methods of digital holography:a comparison (Invited Paper)

Kreis,T.M. ; Adams,M. ; Juptner,W.P.O.

Pub. info.:	Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG. pp.224-233, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3098

Conference Proceedings

8. Some ways to improve the recognition of imperfections in large-scale components using shearography

Osten,W. ; Kalms,M.K. ; Juptner,W.P.O.

Pub. info.:	Interferometry '99 : applications : 20-23 September 1999, Pułtusk, Poland. pp.244-256, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3745

Conference Proceedings

9. Detection and compensation of misalignment for interferometric diagnostic tools applied in space-borne facilities

Kebbel,V. ; Hartmann,H.-J. ; Juptner,W.P.O. ; Schnars,U. ; Gatti,L. ; Becker,J.

Pub. info.:	Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part B pp.468-476, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4101

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Conference Proceedings

10. Combined 3D-shape and deformation analysis of small objects using coherent optical techniques on the basis of digital holography

Seebacher,S. ; Baumbach,T. ; Osten,W. ; Juptner,W.P.O.

Pub. info.:	Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA. Part B pp.520-531, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4101

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