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11 results

Conference Proceedings

1. Laser-induced generation of shaped holes by variable beam shaping [6157-19]

Stephen, A. ; Metev, S. ; Juptner, W. ; Vollertsen, F.

Pub. info.:	Workshop on laser applications in Europe : 23 November 2005, Dresden, Germany. pp.61570I-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6157

Conference Proceedings

2. Active alignment for interferometric techniques onboard the International Space Station

Kebbel, V. ; Becker, J. ; Juptner, W.

Pub. info.:	Interferometry XII: Applications. pp.218-228, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5532

Conference Proceedings

3. Integrated quality assurance for assembly and testing of complex structures [5999-24]

von Kopylaw, C. ; Bothe, T. ; Elandaloussi, F. ; Kalms, M. ; Juptner, W.

Pub. info.:	Intelligent Systems in Design and Manufacturing VI. pp.59990L-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5999

Conference Proceedings

4. Compression of digital holographic data using its electromagnetic field properties [5908-12]

Kayser, D. ; Kreis, T. ; Juptner, W.

Pub. info.:	Optical Information Systems III. pp.59080C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5908

Conference Proceedings

5. Optimized setup for active compensation of distortions for interferometric techniques onboard the International Space Station (Invited Paper) [6292-19]

von Kopylow, C. ; Kebbel, V. ; Becker, J. ; Juptner, W.

Pub. info.:	Interferometry XIII: Techniques and Analysis. pp.62920J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6292

Conference Proceedings

6. Mobile shearography [5852-33]

Kalms, M. ; Juptner, W.

Pub. info.:	Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics. pp.207-213, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5852

Conference Proceedings

7. Impact measurements using double pulse digital holography [6136-24]

Muller, J ; Geldmacher, J. ; Konig, C. ; Calomfirescu, M. ; Kopylow, C. v. ; Juptner, W.

Pub. info.:	Practical Holography XX: Materials and Applications. pp.61360O-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6136

Conference Proceedings

8. Setup calibration and optimization for comparative digital holography

Baumbach, T. ; Osten, W. ; Kebbel, V. ; Kopylow, C.von ; Juptner, W.

Pub. info.:	Interferometry XII: Applications. pp.16-27, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5532

Conference Proceedings

9. Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holography [5856-71]

Kebbel, V. ; Geldmacher, J. ; Partes, K. ; Juptner, W.

Pub. info.:	Optical Measurement Systems for Industrial Inspection IV. pp.856-864, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5856

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Conference Proceedings

10. Combined measurement of silicon microbeams by grating interferometry and digital holography

Juptner, W. ; Kujawinska, M. ; Osten, W. ; Salbut, L. ; Seebacher, S.

Pub. info.:	International Conference on Applied Optical Metrology. pp.348-357, 1998. Bellingham, Wash.. SPIE--International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3407

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Author: Juptner, W.