1.

Conference Proceedings

Conference Proceedings
Hohne,M. ; Juda,U. ; Martynov,Yu.V. ; Gregorkiewicz,T. ; Ammerlaan,C.A.J. ; Vlasenko,L.S.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.3  pp.1659-1663,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings

Conference Proceedings
Hohne,M. ; Juda,U. ; Wollweber,J. ; Schulz,D. ; Donecker,J. ; Gerhardt,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.359-364,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201