1.

Conference Proceedings

Conference Proceedings
Li,T. ; Joshi,R.P. ; Fazi,C.
Pub. info.: Ultrafast phenomena in semiconductors IV : 27-28 January 2000, San Jose, California.  pp.112-126,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3940
2.

Conference Proceedings

Conference Proceedings
Joshi,R.P. ; Fazi,C.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1033-1036,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings

Conference Proceedings
Joshi,R.P. ; Tsen,K.T. ; Ferry,D.K. ; Salvador,A.A. ; Botchkarev,A. ; Morkoc,H.
Pub. info.: Ultrafast Phenomena in Semiconductors II.  pp.283-291,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3277
4.

Conference Proceedings

Conference Proceedings
Tsen,K.T. ; Joshi,R.P. ; Ferry,D.K.
Pub. info.: Ultrafast Phenomena in Semiconductors II.  pp.304-313,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3277
5.

Conference Proceedings

Conference Proceedings
Li,J. ; Joshi,R.P. ; McAdoo,J.A.
Pub. info.: Ultrafast Phenomena in Semiconductors II.  pp.187-196,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3277