1.

Conference Proceedings
Conference Proceedings
1. IN SITU DIAGNOSTICS OF EPITAXIAL GROWTH USING REFLECTANCE-DIFFERENCE
Samuelson, Lars ; Jonsson, Jan ; Paulsson, Gert
Pub. info.: Chemical perspectives of microelectronic materials II : symposium held November 26-28, 1990, Boston, Massachusetts, U.S.A..  pp.47-52,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 204
2.

Conference Proceedings
Conference Proceedings
2. Preliminary results on high total dose testing of semiconductor photonic sources: a comparison of VCSELs and resonant-cavity LEDs
Berghmans, Francis ; Coenen, Simon ; Brichard, Benoit ; Vos, Frans ; Decreton, Marc ; Verschaffelt, Guy ; Fuente, Alexis de la ; Veretennicoff, Irina ; Thienpont, Hugo ; Bockstaele, Ronny ; Bienstman, Peter ; Sys, Carl ; Dhoedt, Bart ; Moerman, Ingrid ; Baets, Roel ; Van Daele, Peter ; Jonsson, Jan
Pub. info.: Photonics for space environments VI : 22 July 1998, San Diego, California.  pp.47-56,  1998.  Bellingham, Wash..  SPIE
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3440