1.

Conference Proceedings

Conference Proceedings
Briddon,P.R. ; Heggie,M.I. ; Jones,R.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.457-462,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Gu,Y. ; Ansari,Z. ; Siegel,J. ; Dunsby,C. ; Itoh,M. ; Parsons-Karavassilis,D. ; Tziraki,M. ; Jones,R. ; Dowling,K. ; French,P.M.W. ; Nolte,D.D. ; Headley,W.R. ; Melloch,M.R.
Pub. info.: Hybrid and Novel Imaging and New Optical Instrumentation for Biomedical Applications.  4434  pp.28-36,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4434
3.

Conference Proceedings

Conference Proceedings
Siegel,J. ; Lee,K.C.Benny ; Webb,S.E.D. ; Leveque-Fort,S. ; Cole,M.J. ; Jones,R. ; Dowling,K. ; French,P.M.W. ; Lever,M.J.
Pub. info.: Photon migration, optical coherence tomography, and microscopy : 18-21 June 2001, Munich, Germany.  4431  pp.99-107,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4431
4.

Conference Proceedings

Conference Proceedings
Kukhtarev,N. ; Kukhtareva,T.V. ; Ward,E. ; Jones,J. ; Jones,R. ; Shnitser,P.I.
Pub. info.: Enabling photonic technologies for aerospace applications II : 24-25 April 2000, Orlando, USA.  pp.146-155,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4042
5.

Conference Proceedings

Conference Proceedings
Jones,R. ; Oberg,S. ; Umerski,A.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.551-562,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
6.

Conference Proceedings

Conference Proceedings
Mack,C.A. ; Jug,S. ; Jones,R. ; Apte,P. ; Williams,S. ; Pochkowski,M.
Pub. info.: Metrology, inspection, and process control for microlithography XV.  4344  pp.377-384,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4344
7.

Conference Proceedings

Conference Proceedings
Goss,J.P. ; Jones,R. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.775-780,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
8.

Conference Proceedings

Conference Proceedings
Elsner,J. ; Jones,R. ; Sitch,P.K. ; Frauenheim,Th. ; Heggie,M.I. ; Oberg,S. ; Briddon,P.R.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1203-1210,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
9.

Conference Proceedings

Conference Proceedings
Goss,J.P. ; Jones,R. ; Breuer,S.J. ; Briddon,P.R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.781-786,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
10.

Conference Proceedings

Conference Proceedings
Hoffmann,L. ; Bach,J.C. ; Hansen,J.Lundsgaard ; Larsen,A.Nylandsted ; Nielsen,B.Bech ; Leary,P. ; Jones,R. ; Oberg,S.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.97-102,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263