1.

Conference Proceedings

Conference Proceedings
Jones,B.K. ; Kirsch,J.C.
Pub. info.: Algorithms and systems for optical information processing V : 31 July-2 August, 2001, San Diego, [California] USA.  pp.81-89,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4471
2.

Conference Proceedings

Conference Proceedings
Kirsch,J.C. ; Jones,B.K. ; Banish,M.R. ; Ranganath,H.S. ; Viviano,J.N.
Pub. info.: Algorithms and systems for optical information processing V : 31 July-2 August, 2001, San Diego, [California] USA.  pp.147-158,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4471
3.

Conference Proceedings

Conference Proceedings
Kirsch,J.C. ; Jones,B.K. ; Kang,K. ; Sanders
Pub. info.: Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida.  pp.66-71,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4043
4.

Conference Proceedings

Conference Proceedings
Jones,B.K. ; Kirsch,J.C.
Pub. info.: Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida.  pp.72-79,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4043
5.

Conference Proceedings

Conference Proceedings
Jones,B.K. ; Santana,J.M. ; Sloan,T.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1039-1044,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Jones,B.K. ; Iqbal,M.A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.933-938,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings

Conference Proceedings
Jones,B.K.
Pub. info.: Materials, Devices, and Systems for Optoelectronic Processing.  pp.29-38,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2848
8.

Conference Proceedings

Conference Proceedings
Kirsch,J.C. ; Jones,B.K. ; Booth,J.J. ; Duffey,J.N. ; Loudin,J.A. ; Sloan,J.A.
Pub. info.: Materials, Devices, and Systems for Optoelectronic Processing.  pp.10-19,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2848
9.

Conference Proceedings

Conference Proceedings
Kang,K. ; Powell,J.S. ; Stack,R.D. ; Garvin,C.G. ; Trezza,J.A. ; Sanders ; Kirsch,J.C. ; Jones,B.K.
Pub. info.: Optical Pattern Recognition X.  pp.97-107,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3715
10.

Conference Proceedings

Conference Proceedings
Kirsch,J.C. ; Jones,B.K. ; Crowe,W.M.
Pub. info.: Optical Pattern Recognition X.  pp.228-235,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3715