Algorithms and systems for optical information processing V : 31 July-2 August, 2001, San Diego, [California] USA. pp.81-89, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Algorithms and systems for optical information processing V : 31 July-2 August, 2001, San Diego, [California] USA. pp.147-158, 2001. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida. pp.66-71, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical pattern recognition XI : 26-27 April, 2000, Orlando, Florida. pp.72-79, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.1039-1044, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part2 pp.933-938, 1997. Zurich, Switzerland. Trans Tech Publications
Materials, Devices, and Systems for Optoelectronic Processing. pp.29-38, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Materials, Devices, and Systems for Optoelectronic Processing. pp.10-19, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering