Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

11 results

Conference Proceedings

1. The Effect of a Thin Sample on the Extended Defect Evolution in Si+ Implanted Si

Li, Jing-Hong ; Jones, Kevin S.

Pub. info.:	Semiconductor process and device performance modeling : symposium held December 2-3, 1997, Boston, Massachusetts, U.S.A.. pp.47-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	490

Conference Proceedings

2. Microstructures of GaN Films Grown on a LiGaO2 New Substrate by Metalorganic Chemical Vapor Deposition

Li, Jing-Hong ; Kryliouk, Olga M. ; Holloway, Paul H. ; Anderson, Timothy J. ; Jones, Kevin S.

Pub. info.:	Gallium nitride and related materials II : symposium held April 1-4, 1997, San Francisco, California, U.S.A.. pp.167-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	468

Conference Proceedings

3. The Effects of Implanted Nitrogen on Diffusion of Boron and Evolution of Extended Defects

Park, Heemyong ; Ilderem, Vida ; Jasper, Craig ; Kaneshiro, Mike ; Christiansen, Jim ; Jones, Kevin S.

Pub. info.:	Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.. pp.425-, 1997. Pittsburg, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	469

Conference Proceedings

4. Defect Evolution From Low Energy, Amorphizing, Germanium Implants on Silicon

Gutierrez, Andres F. ; Jones, Kevin S. ; Downey, Daniel F.

Pub. info.:	Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	669

Conference Proceedings

5. Process Modeling for Advanced Devices

Law, Mark E. ; Jones, Kevin S. ; Radic, Ljubo ; Crosby, Robert ; Clark, Mark ; Gable, Kevin ; Ross, Carrie

Pub. info.:	Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.69-76, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	810

Conference Proceedings

6. The Role of Stress on the Shape of the Amorphous-Crystalline Interface and Mask-Edge Defect Formation in Ion-Implanted Silicon

Ross, Carrie E. ; Jones, Kevin S.

Pub. info.:	Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.449-454, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	810

Conference Proceedings

7. The Effect of Oxide Trenches on Defect Formation and Evolution in Ion-Implanted Silicon

Burbure, Nina ; Jones, Kevin S.

Pub. info.:	Silicon front-end junction formation : physics and technology : symposium held April 13-15, 2004, San Francisco, California, U.S.A.. pp.201-208, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	810

Conference Proceedings

8. The Role of Ion Mass on End-of-Range Damage in Shallow Preamorphizing Silicon

Clark, Mark H. ; Jones, Kevin S. ; Haynes, Tony E. ; Barbour, Charles J. ; Minor, Kenneth G. ; Andideh, Ebrahim

Pub. info.:	Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.. 2001. Warrendale, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	669

Conference Proceedings

9. Effect of Laser Thermal Processing on Defect Evolution in Silicon

Kuryliw, Erik ; Jones, Kevin S. ; Sing, David ; Rendon, Michael J. ; Talwar, Somit

Pub. info.:	Silicon front-end junction formation technologies : symposium held April 2-4, 2002, San Francisco, California, U.S.A.. pp.39-44, 2002. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	717

10.

Conference Proceedings

10. Study Of The Effects Of A Two-Step Anneal On The End Of Range Defects In Silicon

Camillo-Castillo, Renata A. ; Jones, Kevin S. ; Law, Mark E. ; Rubin, Leonard M.

Pub. info.:	Silicon front-end junction formation technologies : symposium held April 2-4, 2002, San Francisco, California, U.S.A.. pp.21-26, 2002. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	717

11 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by: