1.

Conference Proceedings
Conference Proceedings
1. IN-SITU SPECTROSCOPIC ELLIPSOMETRY APPLIED TO ZnSe AND ZnCdSe GROWTH PROCESS IN ORGANOMETALLIC VAPOR PHASE EPITAXY
Iacoponi, J. ; Bhat, I.B. ; Johs, B. ; Woollam, J.A.
Pub. info.: Wide band gap semiconductors : symposium held December 2-6, 1991, Boston, Massachusetts, U.S.A..  pp.237-242,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 242
2.

Conference Proceedings
Conference Proceedings
2. REAL-TIME ANALYSIS OF IN-SITU SPECTROSCOPIC ELLIPSOMETRIC DATA DURING MBE GROWTH OF III-V SEMICONDUCTORS
Johs, B. ; Edwards, J. L. ; Shiralagi, K. T. ; Droopad, R. ; Choi, K. Y. ; Maracas, G. N. ; Meyer, D. ; Cooney, G. T. ; Woollam, John A.
Pub. info.: Atomic layer growth and processing : symposium held April 29 - May 1, 1991, Anaheim, California, U.S.A..  pp.75-80,  1991.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 222
3.

Conference Proceedings
Conference Proceedings
3. Ellipsometric Monitoring of Defects Induced by Electron Cyclotron Resonance Etching of GaAs
Snyder, P. G. ; Ianno, N. J. ; Wigert, B. ; Pittal, S. ; Johs, B. ; Woollam, J. A.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.689-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
4.

Conference Proceedings
Conference Proceedings
4. Spectroscopic ellipsometry analysis of InGaN/GaN and AlGaN/GaN heterostructures using a parametric dielectric function model
Wagner, J. ; Ramakrishnan, A. ; Ohloh, H. ; Kunzer, M. ; Kohler, K. ; Johs, B.
Pub. info.: GaN and related alloys - 1999 : symposium held November 28-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.W11.54.1-,  2000.  Warrendale, Pa..  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 595
5.

Conference Proceedings
Conference Proceedings
5. Effects of ordering on the optical properties of GalnP2
Levi, D. H. ; Geisz, J. F. ; Johs, B.
Pub. info.: Fourth international conference on solid state lighting : 3-6 August 2004, Denver, Colorado, USA.  pp.326-337,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5530
6.

Conference Proceedings
Conference Proceedings
6. Real-Time Monitoring of Semiconductor Growth by Spectroscopic Ellipsometry
Johs, B. ; Hale, J. ; Herzinger, C. ; Doctor, D. ; Elliott, K. ; Olson, G. ; Chow, D. ; Roth, J. ; Ferguson, I. ; Pelczynski, M. ; Kuo, C. H. ; Johnson, S.
Pub. info.: In situ process diagnostics and intelligent materials processing : symposium held December 2-5, 1997, Boston, Massachusetts, U.S.A..  pp.3-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 502
7.

Conference Proceedings
Conference Proceedings
7. Spectroscopic Ellipsometry Study of HgCdTe Epilayer Surfaces During Electron Cyclotron Resonance Plasma Etching
Johnson, J. N. ; Dinan, J. H. ; Singley, K. M. ; Martinka, M. ; Johs, B.
Pub. info.: Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.  pp.293-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 450