Blank Cover Image

Effects of reverse bias annealing and zero bias annealing on Ti/n-GaAs and Au/n-GaAs Schottky barriers containing hydrogen

Author(s):
Publication title:
Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
Title of ser.:
Materials science forum
Ser. no.:
83-87
Pub. Year:
1992
Vol.:
Pt.2
Page(from):
587
Page(to):
592
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496280 [0878496289]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

Yuan, M. H., Jia, Y. Q., Qin, G. G.

MRS - Materials Research Society

G. Chen, Z. Y. Li, S. Bai, P. Han

Society of Photo-optical Instrumentation Engineers

Christianson, K. A.

Materials Research Society

Chen, Tao, Wu, Hua, Wang, Qing Hui

Trans Tech Publications

Christianson, K. A.

Materials Research Society

X.Y. Song, Y.L. Wang, W.J. Zhang, S.X. Hui, W.J. Ye

Trans Tech Publications

Tavendale, A. J., Pearton, S. J., Williams, A. A., Alexiev, D.

Materials Research Society

Wang,S.X., Chen,G., Knight,T.

SPIE-The International Society for Optical Engineering

Pearton, S. J., Ren, F., Abernathy, C. R., Katz, A., Hobson, W. S., Chu, S. N. G., Kovalchick, J.

Materials Research Society

Jin, X., Zhang, M., Dong, G. S., Zhu, X. G., Xu, M., Chen, Y., Shen, X. L., Wang, Xun

MRS - Materials Research Society

S.L. Zhu, G.Q. Xie, F.X. Qin, X.M. Wang

Trans Tech Publications

Y. Chen, X.M. Huang, J.W. Wang, X.S. Zeng

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12