1.

Conference Proceedings
Conference Proceedings
1. Electron cyclotron resonance CVD of silicon oxynitride for optoelectronic applications
Boudreau, M. ; Boumerzoug, M. ; Kruzelecky, R. V. ; Mascher, P. ; Jessop, P. E. ; Thompson, D. A.
Pub. info.: III-V electronic and photonic device fabrication and performance : symposium held April 12-15, 1993, San Francisco, California, U.S.A..  pp.183-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 300
2.

Conference Proceedings
Conference Proceedings
2. Index of Refraction and Strain-Induced Birefringence of Pseudomorphic Si1-xGex
Mailhot, S. ; Baribeau, J. M. ; Bruce, D. M. ; Delage, A. ; Janz, S. ; Jessop, P. E. ; Lafontaine, H. ; Robillard, M. ; Williams, R. L. ; Xu, D. X.
Pub. info.: Materials and devices for silicon-based optoelectronics : symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A..  pp.101-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 486
3.

Conference Proceedings
Conference Proceedings
3. Trench isolated rib waveguides on silicon-on-insulator
Turnbull, A. E. ; Waldron, P. D. ; Picard, M. -J. ; Tarr, N. G. ; Jessop, P. E.
Pub. info.: Applications of photonic technology [7A] : closing the gap between theory, development, and application : 7A--Photonics North 2004: Optical components and devices.  pp.486-495,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5577
4.

Conference Proceedings
Conference Proceedings
4. Monolithically integrated photodetectors for optical signal monitoring in silicon waveguides (Invited Paper) [6125-17]
Knights, A. P. ; Bradley, J. D. B. ; Gou, S. H. ; Jessop, P. E.
Pub. info.: Silicon Photonics.  pp.61250J-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6125