1.

Conference Proceedings

Conference Proceedings
Wolk,J.A. ; Kruger,M.B. ; Heyman,J.N. ; Beeman,J.W. ; Gui-iron,J.G. ; Bourret,E.D. ; Walukiewicz,W.W. ; Jeanloz,R. ; Haller,E.E.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.2  pp.757-762,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87
2.

Conference Proceedings

Conference Proceedings
Wetzel,C. ; Walukiewicz,W. ; Haller,E.E. ; Ager,J.W.III ; Chen,A. ; Fischer,S. ; Yu,P.Y. ; Jeanloz,R. ; Grzegory,I. ; Porowski,S. ; Suski,T. ; Amano,H. ; Akasaki,I.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.31-36,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201