1.

Conference Proceedings
Conference Proceedings
1. RF bias effects on properties of hydrogenated amorphous silicon deposited by electron cyclotron resonance plasma-enhanced chemical vapor deposition
Hirano,Y. ; Sato,F. ; Jayatissa,A.H. ; Ohtake,H. ; Takizawa,K.
Pub. info.: Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California.  pp.341-348,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3287
2.

Conference Proceedings
Conference Proceedings
2. Spectroellipsometric study of amorphous thin films
Yamaguchi,T. ; Jayatissa,A.H. ; Kawanishi,K. ; Aoyama,M.
Pub. info.: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.188-191,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2873
3.

Conference Proceedings
Conference Proceedings
3. Spectroellipsometric characterization of SIMOX with a very thin Si layer
Yamaguchi,T. ; Jayatissa,A.H. ; Tonooka,S. ; Aoyama,M. ; Tabe,M. ; Kanda,Y.
Pub. info.: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.278-281,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2873
4.

Conference Proceedings
Conference Proceedings
4. Spectroellipsometric study of sulphur passivation of InAs
Yamaguchi,T. ; Ohshimo,K. ; Jayatissa,A.H. ; Aoyama,M. ; Gong,X.Y. ; Makino,T. ; Kan,H.
Pub. info.: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.282-285,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2873