Allen, R. D. ; Opitz, J. ; Ito, H. ; Wallow, T. I. ; Casmier, D. V. ; DiPietro, R. A. ; Brock, P. J. ; Breyta, G. ; Sooriyakumaran, R. ; Larson, C. E. ; Hofer, D. C. ; Varanasi, P. R. ; Mewherter, A. M. ; Jayaraman, S. ; Vicari, R. ; Rhodes, L. F. ; Sun, S.
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.66-77, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Varanasi, P. R. ; Maniscalco, J. ; Mewherter, A. M. ; Lawson, M. C. ; Jordhamo, G. ; Allen, R. D. ; Opitz, J. ; Ito, H. ; Wallow, T. I. ; Hofer, D. C. ; Langsdorf, L. ; Jayaraman, S. ; Vicari, R.
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.51-65, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wallow, T. I. ; Brock, P. J. ; DiPietro, R. A. ; Allen, R. D. ; Opitz, J. ; Sooriyakumaran, R. ; Hofer, D. C. ; Mewherter, A. M. ; Cui, Y. ; Yan, W. ; Worth, G. ; Moreau, W. M. ; Meute, J. ; Byers, J. D. ; Rich, G. K. ; McCallum, M. ; Jayaraman, S. ; Vicari, R. ; Cagle, J. ; Sun, S. ; Hullihen, K. A.
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Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California. pp.26-35, 1999. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Tittmann, B.R. ; Jayaraman, S. ; Miyasaka, C. ; Welsch, J. ; Hymer, W.C. ; Nicholas, N.C.
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Health monitoring and smart nondestructive evaluation of structural and biological systems III : 15-17 March 2004, San Diego, California, USA. pp.248-254, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Jayaraman, S. ; Tittmann, B.R. ; Shull, P.J. ; Maillis, G. ; Lenahan, P.M. ; Ze, F.
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Nondestructive detection and measurement for homeland security II : 16-17 March 2004, San Deigo, California, USA. pp.8-14, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Meyer, G. W. ; Jayaraman, S. ; Lee, Y. J. ; Lyle, G. D. ; Glass, T. E. ; McGrath, J. E.
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High performance polymers and polymer matrix composites : symposium held April 13-16, 1993, San Francisco, California, U.S.A.. pp.3-, 1993. Pittsburgh, Pa.. MRS - Materials Research Society
Grove, N. R. ; Kohl. P. A. ; Bidstrup-Allen, S. A. ; Shick, R. A. ; Goodall, B. L. ; Jayaraman, S.
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Low-dielectric constant materials III : symposium held April 1-4, 1997, San Francisco, California, U.S.A.. pp.3-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society
Heerden, D. Van. ; Gavens, A. J. ; Jayaraman, S. ; Weihs, T. P.
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Phase transformations and systems driven far from equilibrium : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.533-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Jayaraman, S. ; Mann, A. B. ; Knio, O. M. ; Heerden, D. Van ; Bao, G. ; Weihs, T. P.
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Phase transformations and systems driven far from equilibrium : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.563-, 1998. Warrendale, Pa.. MRS - Materials Research Society