1.

Conference Proceedings
Conference Proceedings
1. Role of growth defects on carrier dynamics: semi-insulating GaAs
Mizeikis,V. ; Jarasiunas,K. ; Storasta,J. ; Gudelis.V. ; Bastiene,L. ; Sudzius,M.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.163-170,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
2.

Conference Proceedings
Conference Proceedings
2. Nonlinear-carrier-transport-governed nonresonant optical nonlinearity in A3B5 crystals (Invited Paper)
Jarasiunas,K. ; Subacius,L.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.118-131,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
3.

Conference Proceedings
Conference Proceedings
3. Influence of Growth Defects on Carrier Lifetime and Transport in Semiinsulating GaAs Studied by Transient Light-Induced Grating Technique
Mizeikis,V. ; Jarasiunas,K. ; Gudelis,V. ; Sodzius,M.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.115-118,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
4.

Conference Proceedings
Conference Proceedings
4. Nondestructive Characterisation of MOVPE-Grown CdTe and ZnTe Epilayers by Picosecond and Nanosecond"Excite-Probe"Techniques
Gaubas,E. ; Mizeikis,V. ; Bastiene,L. ; Jarasiunas,K. ; Lovergine,N. ; Mancini,A.M. ; Prete,P. ; Subacius,L.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.111-114,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
5.

Conference Proceedings
Conference Proceedings
5. D-SCAN:an instrument for nondestructive monitoring of growth defects in GaAs wafers
Jarasiunas,K. ; Vaitkus,J. ; Gaubas,E. ; Kapturauskas,J. ; Vasiliauskas,R.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.538-544,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648
6.

Conference Proceedings
Conference Proceedings
6. Optical nonlinearities in GaAs at EL2 quenching by short laser pulses
Sudzius,M. ; Bastiene,L. ; Jarasiunas,K.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.232-238,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648
7.

Conference Proceedings
Conference Proceedings
7. Enhancement of light diffraction efficiency in semiconductors by microwave electric field:experiment and calculations
Subacius,L. ; Gruzinskis,V. ; Starikov,E. ; Shiktorov,P. ; Jarasiunas,K.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.207-214,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648
8.

Conference Proceedings
Conference Proceedings
8. Nondestructive characterization of porous silicon structures by transient grating technique
Jarasiunas,K. ; Sudzius,M. ; Subacius,L. ; Simkiene,I. ; Mizeikis,V.
Pub. info.: International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.  pp.226-231,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2648