1.

Conference Proceedings
Conference Proceedings
1. Some Issues on Controlling the Morphology of the Pores Formed in Monocrystalline Silicon by Electrochemical Process
Domanski,K. ; Polrolnik,E. ; Beck,R.B. ; Jakubowski,A. ; Zak,J.K.
Pub. info.: Physics of - Semiconductor Devices -.  Part 1  pp.628-631,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
2.

Conference Proceedings
Conference Proceedings
2. Non-Equilibrium Related Effects in MOS-SOI Structures Capacitance-Voltage Measurements Analysis
Zareba,A. ; Ikraiam,F. ; Beck,R.B. ; Jakubowski,A.
Pub. info.: Physics of - Semiconductor Devices -.  Part 2  pp.1080-1082,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
3.

Conference Proceedings
Conference Proceedings
3. A. Comparison of C-V and I-V Characteristics of Partially and Fully Depleted Gate-Controlled Diodes
Gibki,J. ; Jakubowski,A. ; Jurezak,M. ; Tomaszewski,D.
Pub. info.: Physics of - Semiconductor Devices -.  Part 2  pp.1006-1009,  1998.  New Delhi.  Narosa Publishing House
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3316
4.

Conference Proceedings
Conference Proceedings
4. Role of Endothelial Nitric Oxide in Pleiotropic Action of Cardiovascular Drugs: Nebivolol
Grglewski,R.J. ; Uracz,W. ; Marcinkiewicz,E. ; Jakubowski,A. ; Malinski,T.
Pub. info.: Nitric oxide : basic research and clinical applications.  pp.57-70,  2001.  Amsterdam.  IOS Press
Title of ser.: NATO Science Series. Series A, Life Sciences
Ser. no.: 317
5.

Conference Proceedings
Conference Proceedings
5. The Comparison of SOI Transistor Models
Jurczak,M. ; Jakubowski,A. ; Lukasiak,L.
Pub. info.: Semiconductor Devices.  pp.11-18,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733
6.

Conference Proceedings
Conference Proceedings
6. Interface Trap Characterization Using Charge-Pumping Method
Nowak,B. ; Jakubowski,A. ; Szostak,S. ; Gawrys,R. ; Lukasiak
Pub. info.: Semiconductor Devices.  pp.541-543,  1996.  Bellingham, WA, New Delhi.  SPIE-The International Society for Optical Engineering — Narosa
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2733
7.

Technical Paper
Technical Paper
7. Using Time-Frequency and Wavelet Analysis to Assess Turbulence/Rotor Interactions
Kelley,N. ; Osgood,R. ; Bialasiewicz,J. ; Jakubowski,A.
Pub. info.: A collection of the 2000 ASME Wind Energy Symposium technical papers at the 38th AIAA Aerospace Science Meeting and Exhibition, Reno, NV, 10-13 January, 2000.  pp.130-149,  2000.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : Aerospace Sciences Meeting and Exhibit
Ser. no.: 2000