Pal, D.K. ; Guha, J. ; Jain, H. ; Shankar, R. ; Roy, J.N.
Pub. info.:
Proceedings of the Eleventh International Workshop on the Physics of Semiconductor Devices : (December 11-15, 2001). VOL-1 pp.695-699, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Disordered materials and interfaces : symposium held November 27-30, 1995, Boston Massachusetts, U.S.A.. pp.215-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Song, R. ; Mu, X. ; Ganjoo, A. ; Ding, Y. J. ; Jain, H.
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Chemical and biological point sensors for homeland defense II : 26-27 October, 2004, Philadelphia, Pennsylvania, USA. pp.58-64, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Jin, O. ; Schwarz, R. B. ; Alamgir, F. M. ; Jain, H.
Pub. info.:
Nucleation and growth processes in materials : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.277-, 2000. Pittsburgh, Pa.. MRS-Materials Research Society
Nowick, A. S. ; Vaysleyb, A. V. ; Jain, H. ; Lu, X.
Pub. info.:
Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.99-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.209-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Jain, H. ; Kamitsos, E. I. ; Huang, W. C. ; Yiannopoulos, Y. D.
Pub. info.:
Electrically based microstructural characterization : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A.. pp.143-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society