1.

Conference Proceedings
Conference Proceedings
1. (7.4) 3:20 - 3:50 PM - Optoelectronic Substrates by SiGen NanoTecTM-A General Layer-Transfer (LT) Approach (Invited)
Malik, I. J. ; Lamm, A. J. ; Sullivan, J. ; Kang, S. ; Jacy, D. ; Kirk, H. ; Ong, P. J. ; Henley, F. J. (Silicon Genesis)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.543-554,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07
2.

Conference Proceedings
Conference Proceedings
2. Epitaxial Stacking Faults Formed at the Periphery of the N+ Burled Collector
Nagalingam, S. ; Jacy, D. ; Briggs, K. ; Massetti, D.
Pub. info.: Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects.  pp.94-100,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-1
3.

Conference Proceedings
Conference Proceedings
3. Depth profile characterization of hydrogen implanted silicon using spectroscopic ellipsometry
Gubiotti, T. ; Jacy, D. ; Hoobler, R.J.
Pub. info.: Process and Materials Characterization and Diagnostics in IC Manufacturing.  pp.105-114,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5041