1.

Conference Proceedings
Conference Proceedings
1. DEFECTS IN MBE-GROWN SILICON EPILAYERS STUDIED WITH VARIABLE-ENERGY POSITRONS
Simpson, P.J. ; Schultz, P.J. ; Mitchel, I.V. ; Jackman, T.E. ; Aers, G.C.
Pub. info.: Impurities, defects, and diffusion in semiconductors : bulk and layered structures : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.931-936,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 163
2.

Conference Proceedings
Conference Proceedings
2. ELECTRICAL AND OPTICAL PROPERTIES OF ERBIUM IN MBE SILICON AND Si/Ge ALLOYS
Efeoglu, H. ; Evans, J.H. ; Langer, J.M. ; Peaker, A.R. ; Rowell, N.L. ; Noel, J.-P. ; Perovic, D.D. ; Jackman, T.E. ; Houghton, D.C.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.367-372,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220
3.

Conference Proceedings
Conference Proceedings
3. Ge AND GeSi HETEROEPITAXY ON Si(100) BY MBE
Houghton, D.C. ; Bariebeau, J.-M. ; Maigne, P. ; Jackman, T.E. ; Bassignana, I.C. ; Tan, C.C. ; Holt., R.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.411-416,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
4.

Conference Proceedings
Conference Proceedings
4. RBS/CHANNELING AND TEN ANALYSIS OF THIN SANDWICHED EPI-LAYERS OF GERMANIUM ON SILICON
Swanson, M.L. ; Parikh, N.P. ; Frey, E.C. ; Sandhu, G.S. ; Chu, W.K. ; Baribeau, J.-M. ; Song, Kechang ; McCaffrey, J. ; Jackman, T.E.
Pub. info.: Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A..  pp.581-586,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 138
5.

Conference Proceedings
Conference Proceedings
5. INTERFACE STRUCTURE OF Ge/Si SUPERLATTICES DETERMINED BY X-RAY ABSORPTION FINE STRUCTURE
Aebi, P. ; Tyliszczak, T. ; Hitchcock, A.P. ; Baribeau, J.-M. ; Lockwood, D.L. ; Jackman, T.E.
Pub. info.: Silicon molecular beam epitaxy : symposium held April 29-May 3, 1991, Anaheim, California, U.S.A..  pp.253-258,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 220