1.

Conference Proceedings
Conference Proceedings
1. Metallic impurities and their impact on the formation of internal gettering layer in silicon wafers
Jablonski, J.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.295-308,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. Internal thermal oxidation of discontinuous buried SiO2 layers in silicon
Jablonski, J. ; Saito, M. ; Miyamura, Y. ; Katayama, T.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.51-56,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
3.

Conference Proceedings
Conference Proceedings
3. The role of Oxygen Impurities in the Formation of Grown-in Laser Scattering Tomography Defects in Silicon Single Crystals
Nishimura, M. ; Yamaguchi, Y. ; Nakamura, K. ; Jablonski, J. ; Watanabe, M.
Pub. info.: Proceedings of the Fifth International Symposium on High Purity Silicon V.  pp.188-199,  1998.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 98-13
4.

Conference Proceedings
Conference Proceedings
4. Effective Gas Detection Siting
Jablonski, J.
Pub. info.: AIChE 1994 SUMMER MEETING - DENVER, CO - AUGUST 14-17, 1994.  1994.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1994
5.

Conference Proceedings
Conference Proceedings
5. Hydrogenation of citral in the liquid phase over new bimetallic Ni-M catalysts
Court, J. ; Jablonski, J. ; Hamar-Thibault, S.
Pub. info.: Heterogeneous Catalysis and Fine Chemicals III : proceedings of the 3rd international symposium, Poitiers, April 5-8, 1993.  pp.155-,  1993.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 78
6.

Conference Proceedings
Conference Proceedings
6. Structure of the Defects Responsible for B-Mode Breakdown of Gate Oxide Grown on the Surface of Silicon Wafers
Mera, T. ; Jablonski, J. ; Danbata, M. ; Nagai, K. ; Watanabe, M.
Pub. info.: Defects in electronic materials II : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.107-,  1997.  Pittsburgh, Penn.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 442
7.

Conference Proceedings
Conference Proceedings
7. Heavy metal gettering in SIMOX wafers
Jablonski, J. ; Miyamura, Y. ; Imai, M. ; Tsuya, H.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.28-37,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11