1.

Conference Proceedings
Conference Proceedings
1. Influence of Fin Width on the Intrinsic Voltage Gain of Standard and Strained Triple-Gate nFinFETs
M.A. Pavanello ; J.A. Martino ; E. Simoen ; R. Rooyackers ; N. Collaert
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.253-261,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
2.

Conference Proceedings
Conference Proceedings
2. Influence of the Drain Bias and Gate Length of Partially Depleted SOI MOSFETs on the ZTC Biasing Point
L.M. Camillo ; J.A. Martino ; E. Simoen ; C. Claeys
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.243-252,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
3.

Conference Proceedings
Conference Proceedings
3. Analog Performance of Dynamic Threshold Voltage SOI MOSFET.
J.O. Amaro ; P.G. Agopian ; J.A. Martino
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.169-175,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
4.

Conference Proceedings
Conference Proceedings
4. An Improved Current Model in Saturation for Trapezoidal Finfets
G.P. Martins ; R.C. Giacomini ; J.A. Martino
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.213-221,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
5.

Conference Proceedings
Conference Proceedings
5. Halo Optimization for 0.13µm SOI CMOS Technology
P.G. Agopian ; J.M. Arrabaça ; J.A. Martino
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.111-118,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
6.

Conference Proceedings
Conference Proceedings
6. Corner Effect on Capacitance-Voltage Curves in Triple Gate FinFET
M. Rodrigues ; V. Sonnenberg ; J.A. Martino
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.223-231,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)
7.

Conference Proceedings
Conference Proceedings
7. Carriers Mobility Extraction Methods for Triple-gate FinFET
C.D. Santos ; J.A. Martino
Pub. info.: Microelectonics Technology and Devices - SBMicro 2008.  pp.283-292,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 14(1)