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22 results

Conference Proceedings

1. Impact of Plasma Nitridation Method on VFB Shift and the Reliability of CMOSFETs

D.-C. Kim ; M.-H. Cho ; J.-H. Heo ; B.-Y. Koo ; C.-S. Kim ; Y.-J. Noh ; J.-H. Kim ; K.-B. Clung ; Y. Shin ; D.-W. Moon ; U.-I. Chung ; J.-T. Moon

Pub. info.:	Physics and Chemistry of SiO2 and the Si-SiO2 Interface-5. pp.233-242, 2005. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	1(1)

Conference Proceedings

2. Application of a Photocatalysis System to Wastewater A Detailed Organic Removal of Different Fractions

H. K. Shon ; S. Vigneswaran ; H. H. Ngo ; J.-H. Kim

Pub. info.:	Science and technology in catalysis 2006 : proceedings of the fifth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 23-28, 2006. pp.559-560, 2007. Tokyo. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	172

Conference Proceedings

3. Impedance Analysis on the Transient Behavior of DMFC Anode during Pre-Conditioning Period

J.-H. Kim ; H.-I. Lee ; H. Y. Ha

Pub. info.:	Proton Conducting Membrane Fuel Cells IV : proceedings of the International Symposium. pp.740-753, 2004. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2004-21

Conference Proceedings

4. Destruction of chlorinated organic solvents in a molten carbonate with transition metal oxides

H.-C. Yang ; Y.-J. Cho ; H.-C. Eun ; J.-H. Kim ; Y. Kang

Pub. info.:	New developments and application in chemical reaction engineering : proceedings of the 4th Asia-Pacific Chemical Reaction Engineering Symposium (APCRE '05) : Gyeongju, Korea, June 12-15, 2005. pp.577-580, 2006. Amsterdam. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	159

Conference Proceedings

5. H-ZSM-5 modified with lanthanum and cerium oxides in shape-selective ethylation of ethylbenzene. The deactivation of external acid sites and the control of pore entrance

Y. Sugi ; Y. Kubota ; K. Komura ; N. Sugiyama ; M. Hayashi ; J.-H. Kim

Pub. info.:	Molecular sieves : from basic research to industrial applications : proceedings of the 3rd International Zeolite Symposium (3rd FEZA) Prague, Czech Republic 23-26 August 2005. 158B pp.1279-1286, 2005. Amsterdam. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	158

Conference Proceedings

6. Effect of surface modification by low temperature plasma on the photocatalytic activity of TiO₂ thin film

D.L. Cho ; J.H. Lee ; B.H. Kim ; J.-H. Kim ; G.S. Cha

Pub. info.:	New developments and application in chemical reaction engineering : proceedings of the 4th Asia-Pacific Chemical Reaction Engineering Symposium (APCRE '05) : Gyeongju, Korea, June 12-15, 2005. pp.473-476, 2006. Amsterdam. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	159

Conference Proceedings

7. Preparation and Characterization of Visible Light-sensitive Textile-shaped Titania Photocatalysts

S. H. Kwon ; G. Seo ; J. B. Kim ; S.-J. Song ; J.-H. Kim

Pub. info.:	Science and technology in catalysis 2006 : proceedings of the fifth Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 23-28, 2006. pp.561-562, 2007. Tokyo. Elsevier
Title of ser.:	Studies in surface science and catalysis
Ser. no.:	172

Conference Proceedings

8. Efficient morphological segmentation for significantly overlapped particles

Y.-K. Lee ; J.-H. Kim

Pub. info.:	Nonlinear image processing VI : 6-9 February 1995, San Jose, California. pp.349-357, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2424

Conference Proceedings

9. Effect of pattern density for contact windows in an attenuated phase shift mask

I.-B. Hur ; J.-H. Kim ; I.-H. Lee ; H.-E. Kim ; C.-N. Ahn

Pub. info.:	Optical/laser microlithography VIII : 22-24 February, 1995, Santa Clara, California. pp.278-289, 1995. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2440

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Conference Proceedings

10. Influences of various defects on extreme ultraviolet mask

E.-J. Kim ; J.-H. You ; J.-Y. Lee ; D.-B. Kim ; J.-H. Kim

Pub. info.:	Lithography Asia 2008. 1 pp.71401N-1-71401N-11, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	7140

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Author: J.-H. Kim