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Conference Proceedings

1. Analysis of the Hump Characteristics in Poly-Si Thin Film Transistor

S. Kim ; J. Oh ; J. Yang ; M. Yang ; I. Chung

Pub. info.:	Thin Film Transistor Technology 8. pp.63-67, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	3(8)

Conference Proceedings

2. Carbon Nanotube Yarn Actuators: An Electrochemical Impedance Model

T. Mirfakhrai ; J. Oh ; M. Kozlov ; S. Fang ; M. Zhang

Pub. info.:	Fullerenes, Nanotubes, and Carbon Nanostructures - 213th ECS Meeting. pp.13-27, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(14)

Conference Proceedings

3. Influences of Gate Recess Structure on the DC Characteristics of 0.1 Micron Metamorphic HEMTs

J. Oh ; Y. Back ; S. Choi ; S. Moon ; B. Lee

Pub. info.:	State-of-the-Art Program on Compound Semiconductors XLIV. pp.71-77, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	2(5)

Conference Proceedings

4. Phase Transformation Effects on Weld Distortion and Residual Stress Predictions

J. Oh ; F. W. Brust

Pub. info.:	Proceedings of the ASME Pressure Vessels and Piping Conference 2005. Volume 6. Materials and fabrication : presented at 2005 ASME Pressure Vessels and Piping Conference, July 17-21, 2005, Denver, Colorado, USA. 6 pp.867-880, 2005. New York. American Society of Mechanical Engineers
Title of ser.:	Proceedings of the ASME Pressure Vessels and Piping Division
Ser. no.:	2005(6)

Conference Proceedings

5. Automatic polyp region segmentation for colonoscopy images using watershed algorithm and ellipse segmentation

S. Hwang ; J. Oh ; W. Tavanapong ; J. Wong ; P. C. de Groen

Pub. info.:	Medical imaging 2007, Computer-aided diagnosis : 20-22 February 2007, San Diego, California, USA. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6514

Conference Proceedings

6. Ge on Si Photodiodes for Si CMOS Monolithic Optical Receivers

Z. Huang ; J. Oh ; J.C. Campbell

Pub. info.:	Integrated Optoelectronics 3. pp.1-10, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	3(39)

Conference Proceedings

7. CMOS Scaling For the Next Decade: Trends, Challenges and Opportunities

P. Majhi ; J. Oh ; S. Lee ; R. Harris ; H. Tseng

Pub. info.:	Advanced gate stack, source/drain and channel engineering for Si-based CMOS 4 : new materials, processes and equipment. pp.253-262, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	13(1)

Conference Proceedings

8. Unresolved Issues With Regard to Creep and Creep Fatigue Life Prediction

J. Oh ; N. Katsube ; F. W Brust

Pub. info.:	New and emerging computational methods: applications to fracture, damage, and reliability : presented at the 2002 ASME Pressure Vessels and Piping Conference, Vancouver, British Columbia, Canada, August 5-9, 2002. pp.3-16, 2002. New York, N.Y.. American Society of Mechanical Engineers
Title of ser.:	Proceedings of the ASME Pressure Vessels and Piping Division
Ser. no.:	438

Conference Proceedings

9. Development of 1 kW Class SOFC System at KEPRI

T. Lee ; J. Park ; J. Oh ; Y. Yoo ; J. Bae ; J. Kim

Pub. info.:	Solid oxide fuel cells 10 (SOFC-X). pp.199-204, 2007. Pennington, NJ. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	7(1)

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Conference Proceedings

10. Creep Behavior of a Bimetallic Welded Joint in a Nuclear Piping System

Y. P. Yang ; F. W. Brust ; J. Oh

Pub. info.:	Residual stress, fitness-for-service and manufacturing processes : presented at the 2003 ASME Pressure Vessels and Piping Conference, Cleveland, Ohio, July 20-24, 2003. pp.35-42, 2003. New York, N.Y.. American Society of Mechanical Engineers
Title of ser.:	Proceedings of the ASME Pressure Vessels and Piping Division
Ser. no.:	464

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