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312 results

Conference Proceedings

1. On the Characteristics of L-Band Persistent Scatterers

J. Kim ; W. M. Moon ; W.-M. Boerner

Pub. info.:	Proceedings of the 3rd International Workshop on Science and Applications of SAR Polarimetry and Polarimetric Interferometry, 22-26 January 2007, ESRIN, Frascati, Italy. 2007. Noordwijk, The Netherlands. ESA Publications
Title of ser.:	ESA SP
Ser. no.:	644

Conference Proceedings

2. Inversion of Surface Parameters from NASA/JPL AIRSAR Polarimetric SAR Data

S.-E. Park ; J. Kim ; W. M. Moon ; W.-M. Boerner

Pub. info.:	Proceedings of the 3rd International Workshop on Science and Applications of SAR Polarimetry and Polarimetric Interferometry, 22-26 January 2007, ESRIN, Frascati, Italy. 2007. Noordwijk, The Netherlands. ESA Publications
Title of ser.:	ESA SP
Ser. no.:	644

Conference Proceedings

3. Advancements of the optical vortex coronagraph

G. A. Swartzlander, Jr. ; E. L. Ford ; R. Abdul-Malik ; J. Kim ; L Close

Pub. info.:	Techniques and instrumentation for detection of exoplanets III. pp.669311-1-669311-6, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6693

Conference Proceedings

4. Dynamic aperture optical arrays based on polymeric MEMS actuators for large scale coding elements with application in visible to MWIR

S. Goodwin ; J. Carlson ; S. Rogers ; J. Kim ; C. Kim

Pub. info.:	Adaptive coded aperture imaging and non-imaging sensors. pp.67140C-1-67140C-9, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6714

Conference Proceedings

5. Validation of automatic landmark identification for atlas-based segmentation for radiation treatment planning of the head-and-neck region

C. Leavens ; T. Vik ; H. Schulz ; S. Allaire ; J. Kim

Pub. info.:	Medical imaging 2008. 3 pp.69143G-1-69143G-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6914

Conference Proceedings

6. New conjugated polymer (PININE) with stability for LEDs

S. Song ; Y. Jin ; K. Kim ; J. Kim ; J. Kim

Pub. info.:	Organic light emitting materials and devices XI. pp.66551M-1-66551M-7, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6655

Conference Proceedings

7. Fundamental study on the error factor for sub 90nm OPC modeling

H. Lee ; S.-U. Lee ; J. Kim ; K. Kim

Pub. info.:	Photomask technology 2007. 3 pp.673058-1-673058-8, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6730

Conference Proceedings

8. Improved viewing resolution of three-dimensional integral imaging using pinhole array on LC panel

Y. Kim ; J. Kim ; J.-M. Kang ; J.-H. Jung ; B. Lee

Pub. info.:	Three-dimensional TV, video, and display VI. pp.67780U-1-67780U-8, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6778

Conference Proceedings

9. Variation of the confocal parameters of silver nano-superlens

K. Lee ; J. Kim ; H. Park ; K. Kim

Pub. info.:	Plasmonics. pp.66421D-1-66421D-10, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6642

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Conference Proceedings

10. A novel octree partitioning approach based on camera parameters for unknown object representation

J. Seo ; J. Kim ; S. Lee ; Y. Park

Pub. info.:	ICMIT 2007, mechatronics, MEMS, and smart materials. 1 pp.67942S-1-67942S-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6794

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