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24 results

Conference Proceedings

1. Research on Crack Arrest Toughness of Oil and Gas Pipes

C. J. Zhuang ; Q. R. Ma ; Y. R. Feng ; J. Kang

Pub. info.:	Pipeline Technology : presented at the 18th International Conference on Offshore Mechanics and Arctic Engineering, July 11-16, 1999, St. John's, Newfoundland, Canada. 4 pp.67-72, 1999. New York. American Society of Mechanical Engineers
Title of ser.:	ASME Symposia Volumes
Ser. no.:	OMAE 18(4)

Conference Proceedings

2. Oceanographic Applications of ALOS PALSAR Imagery to the Coast of the Korea Peninsula - A Case Study of the Hebei Spirit Oil Spill

D.-J. Kim ; J. Kang ; Y. Kim

Pub. info.:	Proceedings of the ALOS PI 2008 Symposium, 3-7 November 2008, Island of Rhodes, Greece. 2009. Noordwijk, The Netherlands. ESA Communication Production Office
Title of ser.:	ESA SP
Ser. no.:	664

Conference Proceedings

3. ZnO/ZnSe Type II Core-Shell Nanowire Array Solar Cell

Y. Zhang ; D. Li ; Z. Wu ; J. Zheng ; X. Lin ; H. Zhan ; S. Li ; J. Kang ; J. Bleuse ; L. Grenet ; D. Rapisarda ; H. Mariette

Pub. info.:	Compound semiconductors for generating, emitting, and manipulating energy : symposium held November 28-December 2, 2011, Boston, Massachusetts, U.S.A.. pp.87-92, 2012. Warrendale, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	1396

Conference Proceedings

4. Rate control strategy based on human visual sensitivity for MPEG video coder

S. Paek ; J. Kang ; Y. Seo

Pub. info.:	Visual communications and image processing '94 : 25-29 September 1994, Chicago, Illinois. pp.322-330, 1994. Bellingham, WA. Society of Photo-optical Instrumentation Engineers
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2308

Technical Paper

5. Stability of Fluid Motion in a Vehicle Subject to Harmonic Excitations

J. Kang ; H. Oh

Pub. info.:	AIAA meeting papers on disc. 2006. Reston, Va. American Institute of Aeronautics and Astronautics
Title of ser.:	AIAA Paper : Astrodynamics Specialist Conference
Ser. no.:	2006

Conference Proceedings

6. Fracture and Crack Propagation Behavior of 560 MPa Microalloyed Pipeline Steel under Different Cooling Schedules

J.H. Zhao ; D.F. Li ; G. Yuan ; X.Q. Wang ; R.H. Li ; J. Kang ; H.S. Di

Pub. info.:	IUMRS International Conference in Asia. pp.1094-1102, 2017. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	898

Conference Proceedings

7. Hardware, materials, and parameters optimization for improvement of immersion overlay

W. Ma ; Y. Hwang ; E. Kang ; S. Park ; J. Kang ; C. Lim ; S. Moon

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

Conference Proceedings

8. Enhanced hole shape of flash devices in ArF lithography by eliptical mask bias technique

Y. Jeon ; S. Jun ; J. Kang ; S. Lee ; J. Kim ; K. Kim

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

Conference Proceedings

9. Advanced new OPC method to improve OPC accuracy for sub-90nm technology

J. Choi ; J. Kang ; Y. Shim ; K. Yun ; J. Hong ; Y. Lee ; K. Kim

Pub. info.:	Optical microlithography XX. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6520

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Conference Proceedings

10. Methodology to set up accurate OPC model using optical CD metrology and atomic force microscopy

Y. Shim ; J. Kang ; S. Lee ; J. Kim ; K. Kim

Pub. info.:	Metrology, inspection, and process control for microlithography XXI. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6518

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Author: J. Kang