1.

Conference Proceedings
Conference Proceedings
1. Development of Thin Film and Nanorod ZnO-Based LEDs and Sensors
S. J. Pearton ; L. C. Tien ; H. S. Kim ; D. P. Norton ; J. J. Chen ; H. T. Wang ; B. S. Kang ; F. Ren ; W. T. Lim ; J. Wright ; R. Khanna ; L. F. Voss ; L. Stafford ; J. Jun ; Jenshan. Lin
Pub. info.: Zinc oxide and related materials : symposium held November 27-30, 2006, Boston, Massachusetts, U.S.A..  pp.3-14,  2007.  Warrrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 957
2.

Conference Proceedings
Conference Proceedings
2. Verification of CFD Modeling for 5kW class MCFC Stack Composed of 7 Unit Cells with 7,500cm² in Effective Electrode Area
S. Kim ; Y. Choi ; J. Jun ; H. Lim ; J. Lee
Pub. info.: Fuel Cell Seminar 2007.  pp.467-474,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 12(1)
3.

Conference Proceedings
Conference Proceedings
3. Biogas Purifyung for Application of MCFC
J. Lee ; J. Jun ; T. Kim ; B. Ahn ; K. Park ; D. Choi ; J. Park
Pub. info.: 30th fuel cell seminar.  pp.733-738,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 5(1)
4.

Conference Proceedings
Conference Proceedings
4. Effects of REM Coatings on Electrical Conductivity of Ferritic Stainless Steels for SOFC Interconnect Applications
J. Jun ; D. Kim
Pub. info.: Solid oxide fuel cells 10 (SOFC-X).  pp.2385-2390,  2007.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 7(1)
5.

Conference Proceedings
Conference Proceedings
5. Fundamental limits of optical critical dimension metrology: a simulation study
R. Silver ; T. Germer ; R. Attota ; B. M. Barnes ; B. Bunday ; J. Allgair ; E. Marx ; J. Jun
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
6.

Conference Proceedings
Conference Proceedings
6. Zero-order imaging of device-sized overlay targets using scatterfield microscopy
B. M. Barnes ; L. P. Howard ; J. Jun ; P. Lipscomb ; R. M. Silver
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518