1.

Conference Proceedings
Conference Proceedings
1. Analysis of the Nucleation Kinetics of Oxide Precipitates in Czochralski Silicon
G. Kissinger ; D. Kot ; J. Dabrowski ; V. Akhmetov ; A. Sattler
Pub. info.: High Purity Silicon 10.  pp.97-108,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(6)
2.

Conference Proceedings
Conference Proceedings
2. Verification of a Method to Detect Grown-in Oxide Precipitate Nuclei in Czochralski Silicon
G. Kissinger ; A. Sattler ; J. Dabrowski ; W. Von Ammon
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes 7.  pp.161-171,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(3)
3.

Conference Proceedings
Conference Proceedings
3. The Influence of Defects and Impurities on Electrical Properties of High-k Dielectrics
J. Dabrowski ; S. Miyazaki ; S. Inumiya ; G. Kozlowski ; G. Lippert
Pub. info.: Advances in electronic materials : special topic volume with invited papers only.  pp.55-110,  2009.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 608
4.

Conference Proceedings
Conference Proceedings
4. Oxide Precipitatation via Coherent "Seed"-Oxide Phases
G. Kissinger ; J. Dabrowski
Pub. info.: High purity silicon 9.  pp.97-112,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(4)
5.

Conference Proceedings
Conference Proceedings
5. Morphology and Composition of Praseodymium Based High-k Materials and Their Relevance to Dielectric Properties of Thin-Films
G. Lippert ; J. Dabrowski ; I. Costina ; G. Lupina ; M. Ratzke ; P. Zaurnseil ; H. Muessig
Pub. info.: Silicon nitride, silicon dioxide, and emerging dielectrics 9.  pp.773-806,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(3)
6.

Conference Proceedings
Conference Proceedings
6. Analytical Modeling of the Interaction of Vacancies and Oxygen for Oxide Precipitation in RTA Treated Wafers
G. Kissinger ; J. Dabrowski ; A. Sattler ; C. Seuring ; T. Mueller ; H. Richter ; W. Von Ammon
Pub. info.: Silicon materials science and technology X.  pp.247-260,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 2(2)