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Conference Proceedings

1. Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers

M. Wilson ; A. Savtchouk ; I. Tasarov ; J. D'Amico ; P. Edelman

Pub. info.:	High Purity Silicon 10. pp.285-301, 2008. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	16(6)

Conference Proceedings

2. Manifestation of Cu Impurities on Silicon Surfaces, Implication for Monitoring Cu Contamination

M. Wilson ; A. Savtchouk ; J. D'Amico ; I. Tasarov ; L. Jastrzebski

Pub. info.:	Analytical and diagnostic techniques for semiconductor materials, devices and processes 7. pp.347-361, 2007. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	11(3)

Conference Proceedings

3. The Present Status and Recent Advancements in Corona-Kelvin Non-Contact Electrical Metrology of Dielectrics for IC-Manufacturing

M. Wilson ; D. Marinskiy ; A. Byelyayev ; J. D'Amico ; A. Findlay ; L. Jastrzebski ; J. Lagowski

Pub. info.:	Physics and technology of high-k gate dielectrics 4. pp.3-24, 2006. Pennington, N.J.. Electrochemical Society
Title of ser.:	ECS transactions
Ser. no.:	3(3)

Conference Proceedings

4. IXV Mock-Up Water Impact Test and Results Correlation

R. Ullio ; V. Becchio ; J. D'Amico ; G. Di Vita

Pub. info.:	12th European conference on structures, materials & environmental testing : proceedings. 2012. Noordwijk. ESA Communications, ESTEC
Title of ser.:	ESA SP
Ser. no.:	691