1.

Conference Proceedings
Conference Proceedings
1. Impact of Halo Implantation on the Lifetime Assessment in Partially Depleted SOI Transistors
M. Galeti ; J. A. Martino ; E. R. Simoen ; C. L. Claeys
Pub. info.: High purity silicon 9.  pp.351-360,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(4)
2.

Conference Proceedings
Conference Proceedings
2. Sidewall Angle Influence on the FinFET Analog Parameters
R. Giacomini ; J. A. Martino ; M. A. Pavanello
Pub. info.: Microelectronics Technology and Devices : SBMICRO 2007.  pp.37-46,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 9(1)
3.

Conference Proceedings
Conference Proceedings
3. Triple Gate FinFET Parameter Extraction Using High Frequency Capacitance - Voltage Curves
M. Rodrigues ; V. Sonnenberg ; J. A. Martino
Pub. info.: Microelectronics Technology and Devices : SBMICRO 2007.  pp.9-18,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 9(1)
4.

Conference Proceedings
Conference Proceedings
4. Low Temperature Operation of Undoped Body Triple-Gate FinFETs from an Analog Perspective
M. A. Pavanello ; J. A. Martino ; E. Simoen ; R. Rooyackers ; N. Collaert ; C. Claeys
Pub. info.: Microelectronics Technology and Devices : SBMICRO 2007.  pp.19-28,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 9(1)
5.

Conference Proceedings
Conference Proceedings
5. Influence of the N-Type FinFET Width on the Zero Temperature Coefficient
M. Bellodi ; J. A. Martino ; L. M. Camiio ; E. Simoen ; C. Claeys
Pub. info.: Microelectronics Technology and Devices : SBMICRO 2007.  pp.29-36,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 9(1)
6.

Conference Proceedings
Conference Proceedings
6. Improved Model to Determine the Generation Lifetime in Short Channel SOI nMOSFETs
M. Galeti ; J. A. Martino ; E. Simoen ; C. Claeys
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.387-392,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
7.

Conference Proceedings
Conference Proceedings
7. Non-Vertical Sidewall Angle Influence on Triple-Gate FinFETs Corner Effects
R. Giacomini ; J. A. Martino
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.381-386,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
8.

Conference Proceedings
Conference Proceedings
8. Temperature Influences on FinFETs with Undoped Body
M. A. Pavanello ; J. A. Martino ; E. Simoen ; R. Rocyackers ; N. Collaert ; C. Claeys
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.211-216,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
9.

Conference Proceedings
Conference Proceedings
9. Simple Analytical Model to Study the ZTC Bias Point in FinFETs
M. Bellodi ; L. Camillo ; J. A. Martino ; E. Simoen ; C. Claeys
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.205-210,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
10.

Conference Proceedings
Conference Proceedings
10. The "C" Shape Behavior of the Floating Body Effect in Function of Temperature in PD SOI nMOSFETs
P. G. Agopian ; J. A. Martino ; E. Simoen ; C. Claeys
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.107-112,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)