1.

Conference Proceedings
Conference Proceedings
1. "Atomic-Scale View of Epitaxial Layers with Cross-Sectional Scanning Tunneling Microscopy"
Johnson B. M. ; Maier U. ; Meier P. H. ; Salemink H. ; Yu T. E. ; Iyer S. S.
Pub. info.: Semiconductor interfaces at the sub-nanometer scale.  pp.207-216,  1993.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 243
2.

Conference Proceedings
Conference Proceedings
2. "Si1-x-yGexCy Growth and Properties of the Ternary System"
Powell R. A. ; Eberl K. ; Ek A. B. ; Iyer S. S.
Pub. info.: Semiconductor interfaces at the sub-nanometer scale.  pp.199-206,  1993.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO ASI series. Series E, Applied sciences
Ser. no.: 243