1.

Conference Proceedings

Conference Proceedings
Takeda, N. ; Itagaki, Y. ; Aono, H. ; Sadaoka, Y. (Ehime University)
Pub. info.: Chemical sensors VI : chemical and biological sensors and analytical methods : proceedings of the international symposium.  pp.194-199,  2004.  Pennington,NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-08
2.

Conference Proceedings

Conference Proceedings
Okamoto, T. ; Kuramoto, A. ; Shimamoto, Y. ; Itagaki, Y. ; Aono, H. ; Sadaoka, Y.(Ehime University)
Pub. info.: Chemical sensors VI : chemical and biological sensors and analytical methods : proceedings of the international symposium.  pp.200-,  2004.  Pennington,NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-08
3.

Conference Proceedings

Conference Proceedings
Fujishima, M. ; Itagaki, Y. ; Aono, H. ; Sadaoka, Y. (Ehime University)
Pub. info.: Chemical sensors VI : chemical and biological sensors and analytical methods : proceedings of the international symposium.  pp.66-72,  2004.  Pennington,NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-08
4.

Technical Paper

Technical Paper
Sato, H. ; Imamoto, Y. ; Itagaki, Y. ; Miyaki, K. ; Abe, S.
Pub. info.: 2007 SAE world congress : technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
5.

Conference Proceedings

Conference Proceedings
Yamada, K. ; Ushiki, T. ; Itagaki, Y. ; Newcomb, R.
Pub. info.: Process and Materials Characterization and Diagnostics in IC Manufacturing.  pp.21-30,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5041
6.

Conference Proceedings

Conference Proceedings
Yamada, K. ; Ushiki, T. ; Itagaki, Y. ; Newcomb, R.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.1143-1152,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038