1.

Conference Proceedings

Conference Proceedings
McCabe,E.M. ; Jordan,C. ; Fewer,D.T. ; Donegan,J.F. ; Taniguchi,S. ; Hino,T. ; Nakano,K. ; Ishibashi,A. ; Uusimaa,P. ; Pessa,M.
Pub. info.: Proceedings of three-dimensional and multidimensional microscopy : image acquisition and processing VI : 24-25 January 1999, San Jose, California.  pp.65-72,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3605
2.

Conference Proceedings

Conference Proceedings
Eguchi,N. ; Ishibashi,A.
Pub. info.: Optical data storage '97 : 7-9 April 1997, Tucson, Arizona.  pp.128-132,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3109
3.

Conference Proceedings

Conference Proceedings
Ishibashi,A.
Pub. info.: Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA.  pp.19-30,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3625
4.

Conference Proceedings

Conference Proceedings
Donegan,J.F. ; Jordan,C. ; Laird,C. ; Taniguchi,S. ; Hino,T. ; Kato,E. ; Noguchi,N. ; Ishibashi,A.
Pub. info.: Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA.  pp.41-48,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3625
5.

Conference Proceedings

Conference Proceedings
Tomiya,S. ; Ukita,M. ; Okuyama,H. ; Nakano,K. ; Itoh,S. ; Ishibashi,A. ; Morita,E. ; Ikeda,M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1109-1116,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Nakano,K. ; Ishibashi,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1329-1334,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings

Conference Proceedings
Toda,A. ; Imanishi,D. ; Yanashima,K. ; Ishibashi,A.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.128-135,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693
8.

Conference Proceedings

Conference Proceedings
Nakayama,N. ; Itoh,S. ; Ishibashi,A. ; Mori,Y.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.36-42,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693
9.

Conference Proceedings

Conference Proceedings
Rees,P. ; Heffernan,J.F. ; Logue,F.P. ; Donegan,J.F. ; Jordan,C. ; Hegarty,J. ; Hiei,F. ; Ishibashi,A.
Pub. info.: Physics and Simulation of Optoelectronic Devices IV.  pp.121-127,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2693
10.

Conference Proceedings

Conference Proceedings
Noguchi,H. ; Tomiya,S. ; Chuang,S.L. ; Ishibashi,A.
Pub. info.: Physics and Simulation of Optoelectronic Devices V.  pp.22-31,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2994