1.

Conference Proceedings
Conference Proceedings
1. Modeling of the Leakage Drain Current in Accumulation-Mode SOI pMOSFETs for High-Temperature Applications
Bellodi, M. ; Iniguez, B. ; Flandre, D. ; Martino, J.A.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.233-238,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
2.

Conference Proceedings
Conference Proceedings
2. Improvement of Sub-0.25 μn Fully-Depleted SOI CMOS Analog Performance by Thinning the Si Film
Nave, A. ; Dessard, V. ; Delatte, P. ; Brodeoux, V. ; Iniguez, B. ; Rauly, E. ; Flandre, D.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.271-276,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
3.

Conference Proceedings
Conference Proceedings
3. Potential of Surface Accumulation Mode for Deep-Submicron Fully-Depleted SOI CMOS Technologies
Iniguez, B. ; Rauly, F. ; Flandre, D.
Pub. info.: Silicon-on-Insulator Technology and Devices X : proceedings of the tenth International Symposium.  pp.251-258,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-3
4.

Conference Proceedings
Conference Proceedings
4. The nanoscale double-gate MOSFET for analog applications
Jimenez, D. ; Iniguez, B. ; Sune, J. ; Saenz, J.J.
Pub. info.: Silicon-on-insulator technology and devices XI : proceedings of the international symposium.  pp.237-242,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-5
5.

Conference Proceedings
Conference Proceedings
5. High frequency noise of SOI MOSFETs: performances and limitations (Invited Paper)
Danneville, F. ; Pailloncy, G. ; Siligaris, A. ; Iniguez, B. ; Dambrine, G.
Pub. info.: Noise in devices and circuits III : 24-26 May, 2005, Austin, Texas, USA.  pp.185-199,  2005.  Bellingham, Washington.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5844
6.

Conference Proceedings
Conference Proceedings
6. Low-Noise High-Temperature SOI Analog Circuits
Dessard, V. ; Iniguez, B. ; Adriaensen, S. ; Flandre, D.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.189-210,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
7.

Conference Proceedings
Conference Proceedings
7. Thin Film Transistor Models for Circuit Simulation Invited Paper
Iniguez, B. ; Shur, M.S. ; Fjeldly, T.A. ; Ytterdal, T.
Pub. info.: Thin Film Transistor Technologies (TFTT VII) : proceedings of the international symposium.  pp.136-145,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-15
8.

Conference Proceedings
Conference Proceedings
8. A Fully Analytical Continuous Model for Graded-Channel SOI MOSFET for Analog Applications
Souza, M. ; Pavanello, M. A. ; Iniguez, B. ; Flandre, D.
Pub. info.: Microelectronics technology and devices : SBMICRO 2004 : proceedings of the nineteenth international symposium.  pp.27-32,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-03
9.

Conference Proceedings
Conference Proceedings
9. Compact model of the nanoscale gate-all-around MOSFET
Jimenez, D. ; Iniguez, B. ; Saenz, J. J. ; Sune, J. ; Marsal, L. F. ; Pallares, J.
Pub. info.: Science and technology of semiconductor-on-insulator structures and devices operating in a harsh environment.  pp.321-326,  2005.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 185