Uddin, M.S. ; Inaba, H. ; Yoshida, Y. ; Itakura, Y.
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Image processing : algorithms and systems : 21-23 January 2002, San Jose, USA. pp.130-138, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Usuda, S. ; Inoue, S. ; Itou, S. ; Inaba, H. ; Jiang, F. ; Okuda, M. ; Chen, Y. H.
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Seventh International Symposium on Optical Storage (ISOS 2005). pp.59661C-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bitou, Y. ; Inaba, H. ; Hong, F. -L. ; Takatsuji, T. ; Onae, A.
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Recent Developments in Traceable Dimensional Measurements III. pp.58790Y-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Recent Developments in Traceable Dimensional Measurements II. pp.448-455, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Seventh International Symposium on Optical Storage (ISOS 2005). pp.596606-596606, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Symposium on Optical Storage (ISOS 2002). pp.145-149, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering