1.

Conference Proceedings

Conference Proceedings
Inatani,J. ; Ozeki,H. ; Satoh,R. ; Nishibori,T. ; Ikeda,N. ; Fujii,Y. ; Nakajima,T. ; Iida,Y. ; Iida,T. ; Kikuchi,K. ; Miura,T. ; Masuko,H. ; Manabe,T. ; Ochiai,S. ; Seta,M. ; Irimajiri,Y. ; Kasai,Y. ; Suzuki,M. ; Shirai,T. ; Tsujimaru,S.
Pub. info.: Microwave remote sensing of the atmosphere and environment II : 9-12 October 2000, Sendai, Japan.  4152  pp.243-254,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4152
2.

Conference Proceedings

Conference Proceedings
Sugimoto,Y. ; Ikeda,N. ; Carlsson,N. ; Kawai,N. ; Inoue,K. ; Asakawa,K.
Pub. info.: Active and passive optical components for WDM communication, 21-24 August 2001, Denver, USA.  4532  pp.180-190,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4532
3.

Conference Proceedings

Conference Proceedings
Sueoka,K. ; Ikeda,N. ; Yamamoto,T. ; Kobayashi,S.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.523-524,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
4.

Conference Proceedings

Conference Proceedings
Ozeki,H. ; Inatani,J. ; Satoh,R. ; Nishibori,T. ; Ikeda,N. ; Fujii,Y. ; Nakajima,T. ; Iida,Y. ; Iida,T. ; Kikuchi,K. ; Miura,T. ; Masuko,H. ; Manabe,T. ; Ochiai,S. ; Seta,M. ; Irimajiri,Y. ; Kasai,Y. ; Suzuki,M. ; Shirai,T. ; Tsujimaru,S.
Pub. info.: Sensors, systems, and next-generation satellites V : 17-20 September 2001, Toulouse, France.  4540  pp.209-220,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4540