1.

Conference Proceedings
Conference Proceedings
1. Back-Up Performance of Electric Double-Layer Capacitors for Rechargeable Batteries.
Nomoto, S. ; Nonaka, S. ; Nishida, K. ; Ikeda, M. ; Yoshida, A. ; Nishino, A.
Pub. info.: Proceedings of the Symposium on Electrochemical Capacitors II.  pp.268-279,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-25
2.

Conference Proceedings
Conference Proceedings
2. A study on the reason why prints made with only cyan and magenta inks look like regular full-color prints
Ikeda, M. ; Omodani, M.
Pub. info.: Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA.  pp.243-250,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5667
3.

Conference Proceedings
Conference Proceedings
3. Ocean circulation revealted by ice floe tracking
Ikeda, M. ; Prinsenberg, S.
Pub. info.: Proceedings of the First ERS-1 Symposium : space at the service of our environment, 4-6 November 1992, Cannes, France.  pp.351-354,  1993.  Paris, France.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 359
4.

Conference Proceedings
Conference Proceedings
4. THE EFFECT OF CONTACT OVERLAP DISTANCE ON a-Si TFT PERFORMANCE
Uchikoga, S. ; Akiyama, M. ; Koizumi, T. ; Ikeda, M. ; Suzuki, K.
Pub. info.: Amorphous silicon technology, 1992.  pp.1025-1030,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 258
5.

Conference Proceedings
Conference Proceedings
5. Ka-Band and Millimeter-Wave Propagation Measurements using the COMETS Satellite
Wakana, H. ; Yamamoto, S.-I. ; Obara, N. ; Ikeda, M. ; Saito, H.
Pub. info.: AP 2000 : millennium Conference on Antennas & Propagation, Davos, Switzerland, 9-14 April 2000.  2000.  Noordwijk, Netherlands.  ESA Publications Division
Title of ser.: ESA SP
Ser. no.: 444
6.

Conference Proceedings
Conference Proceedings
6. Effect of Aluminum on Oxide Growth and Oxide Charges in Silicon Wafers
Shimizu, H. ; Ikeda, M. ; Munakata, C. ; Nagashima, N.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.296-304,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
7.

Conference Proceedings
Conference Proceedings
7. The new technology for selective catalytic oxidation of ammonia to nitrogen
Sano, K. ; Sugishima, N. ; Ikeda, M. ; Yoshino, K. ; Okamura, J.
Pub. info.: Science and technology in catalysis 1998 : proceedings of the Third Tokyo Conference on Advanced Catalytic Science and Technology, Tokyo, July 19-24, 1998.  pp.399-,  1999.  Tokyo.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 121
8.

Conference Proceedings
Conference Proceedings
8. Open loop method for waveform acquisition on electron-beam probe systems
Wang, H. ; Koike, H. ; Ikeda, M. ; Kanai, K.
Pub. info.: Advances in microelectronic device technology : 7-9 November 2001, Nanjing, China.  pp.154-159,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4600
9.

Conference Proceedings
Conference Proceedings
9. Determination of the Aluminum-Induced Oxide Charge by AC Surface Photovoltage Measurements in N-Type Silicon
Shimizu, H. ; Ikeda, M. ; Shin, R.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.31-36,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
10.

Conference Proceedings
Conference Proceedings
10. Low Resistivity Mo-W Alloy for a-Si TFT Gate Electrode
Hara, Y. ; Atsuta, M. ; Oka, T. ; Tsuji, Y. ; Ogawa, Y. ; Takemura, M. ; Ikeda, M. ; Suzuki, K.
Pub. info.: Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.675-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 403