1.

Conference Proceedings
Conference Proceedings
1. Digital SPV Diffusion Length Metrology (E8-Fe) for Ultra-High Purity Silicon Wafers
M. Wilson ; A. Savtchouk ; I. Tasarov ; J. D'Amico ; P. Edelman
Pub. info.: High Purity Silicon 10.  pp.285-301,  2008.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(6)
2.

Conference Proceedings
Conference Proceedings
2. Manifestation of Cu Impurities on Silicon Surfaces, Implication for Monitoring Cu Contamination
M. Wilson ; A. Savtchouk ; J. D'Amico ; I. Tasarov ; L. Jastrzebski
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices and processes 7.  pp.347-361,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 11(3)