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Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63180W-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Hyodo, K. ; Ohno, Y. ; Kanamori, H. ; Kitada, T. ; shimomura, S. ; Hiyamizu, S.
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Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.383-388, 2003. Warrendale, Pa.. Materials Research Society
Takeda, T. ; Wu, J. ; Yoneyama, A. ; Tsuchiya, Y. ; Lwin, T.-T. ; Hirai, Y. ; Kuroe, T. ; Yuasa, T. ; Hyodo, K. ; Dilmanian, F.A. ; Akatsuka, T.
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Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.380-391, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Shimao, D. ; Sugiyama, H. ; Kunisada, T. ; Maksimenko, A. ; Toyofuku, F. ; Ueno, E. ; Yamasaki, K. ; Obayashi, C. ; Hyodo, K. ; Li, G. ; Pan, L. ; Jiang, X. ; Ando, M.
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Medical Imaging 2005: Physics of Medical Imaging. pp.32-39, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering