1.

Conference Proceedings
Conference Proceedings
1. Picosecond nonlinear optical transmission measurement in SiO2/TiO2 one-dimensional photonic crystals [6352-143]
Kim, M. J. ; Hwang, J. ; Lee, S. M. ; Rhee, B. K. ; An, I. ; Uw, J. W.
Pub. info.: Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea.  pp.63523Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6352
2.

Conference Proceedings
Conference Proceedings
2. Characterization of single functionalized quantum dots using combined atomic force and confocal fluorescence microscopy [6096-17]
Kim, D. H. ; Okamoto, K. ; Goldner, L. S. ; Hwang, J.
Pub. info.: Colloidal quantum dots for biomedical applications : 22-24 January 2006, San Jose, California, USA.  pp.60960G-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6096
3.

Conference Proceedings
Conference Proceedings
3. THERMAL STABILITY OF Ir-SILICIDE/SiGe LAYERS GROWN IN A DUAL ELECTRON GUN CHAMBER AT ULTRA-HIGH VACUUM (EXTENDED ABSTRACT)
Chung, C.K. ; Hwang, J.
Pub. info.: Infrared detectors : materials, processing, and devices : symposium held April 14-16, 1993, San Francisco, California, U.S.A..  pp.319-324,  1994.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 299
4.

Conference Proceedings
Conference Proceedings
4. Self energy effects in the cuprates [5932-18]
Timusk, T. ; Hwang, J.
Pub. info.: Strongly correlated electron materials : physics and nanoengineering : 31 July-4 August, 2005, San Diego, California, USA.  pp.59320J-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5932
5.

Conference Proceedings
Conference Proceedings
5. 5 Junction scaling for 90 nm and beyond
Hwang, J. ; Kennel, H. ; Packan, P. ; Taylor, M. ; Liu, M. ; James, R. ; Kuhn, M.
Pub. info.: Advanced short-time thermal processing for Si-based CMOS devices : proceedings of the international symposium.  pp.35-42,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-14
6.

Conference Proceedings
Conference Proceedings
6. Optimization of Nanoporous Separators Based on Plasticized PVDF- HFP Copolymer
Hwang, J. ; Lee, H.M. ; Lee, S.J. ; Aim, S.
Pub. info.: Lithium batteries : proceedings of the international symposium.  pp.599-606,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-25
7.

Conference Proceedings
Conference Proceedings
7. Convolutive source separation and selective null beamforming using a pilot-based channel estimation technique [5910-40]
Hwang, J. ; Lee, J. ; Chun, J.
Pub. info.: Advanced signal processing algorithms, architectures, and implementations XV : 2-4 August, 2005, San Diego, California, USA.  pp.591013-591014,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5910
8.

Conference Proceedings
Conference Proceedings
8. A Method to Extract Physical Properties from Raman Scattering Data in a CVD Reactor
Hwang, J. ; Huang, M. ; Anderson, T. ; Park, C.
Pub. info.: Chemical vapor deposition XVI and EUROCVD 14 : proceedings of the international symposium.  pp.85-91,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-8
9.

Conference Proceedings
Conference Proceedings
9. The Effect of Ti Interlayer on the Hillock Formation of Al-0.5 wt%Cu Films on the TiN/Ti/SiO2/Si Multilayer Structure
Wang, L. P. ; Chuang, A. ; Huang, F. S. ; Hwang, J.
Pub. info.: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.421-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 473
10.

Conference Proceedings
Conference Proceedings
10. Effect of Ar Sputtering Pretreatment on the Electromigration Resistance in Al-Cu/TiN/Ti Interconnects
Wang, L. P. ; Chuang, A. ; Lin, L. T. ; Huang, F. S. ; Perng, K. ; Hwang, J.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.103-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516