1.

Conference Proceedings

Conference Proceedings
Huang, Y.L. ; Sundar, G. ; Fan, L.T.
Pub. info.: AIChE SPRING MEETING, HOUSTON, TEXAS APRIL 7-11, 1991.  1991.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE meeting [papers]
Ser. no.: 1991
2.

Conference Proceedings

Conference Proceedings
Huang, Y.L. ; Li, J. ; Xiang, Y. ; Ma, X.R. ; Kai, G.Y. ; Dong, X.Y.
Pub. info.: Optical components and transmission systems : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-18 October, 2002, Shanghai, China.  pp.90-93,  2002.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4906
3.

Conference Proceedings

Conference Proceedings
Xu, Z.W. ; Yuan, S.Z. ; Zhang, W.G. ; Huang, Y.L. ; Wu, Z.G. ; Dong, X.Y.
Pub. info.: Optical fiber and fiber component mechanical reliability and testing II : 21 January 2002, San Jose, USA.  pp.40-44,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4639
4.

Conference Proceedings

Conference Proceedings
Job, R. ; Ulyashin, A.G. ; Huang, Y.L. ; Fahrner, W.R. ; Simoen, E. ; Claeys, C. ; Niedernostheide, F.-J. ; Schulze, H.-J. ; Tonelli, G.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.257-262,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
5.

Conference Proceedings

Conference Proceedings
Dungen, W. ; Job, R. ; Ma, Y. ; Huang, Y.L. ; Fahrner, W.R. ; Keller, L.O. ; Horstmann, J.T.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.503-508,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
6.

Conference Proceedings

Conference Proceedings
Job, R. ; Dungen, W. ; Ma, Y. ; Huang, Y.L. ; Horstmann, J.T.
Pub. info.: Semiconductor defect engineering - materials, synthetic structures and devices : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A..  pp.487-492,  2005.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 864
7.

Conference Proceedings

Conference Proceedings
Tong, Z.R. ; Huang, Y.L. ; Meng, H.Y. ; Dong, X.Y. ; Kai, G.Y.
Pub. info.: Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China.  pp.454-458,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4920
8.

Conference Proceedings

Conference Proceedings
Tong, Z.R. ; Huang, Y.L. ; Yang, S.Q. ; Feng, D.J. ; Kai, G.Y. ; Zhao,Q. ; Dong, X.Y.
Pub. info.: Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China.  pp.487-491,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4920
9.

Conference Proceedings

Conference Proceedings
Huang, Y.L. ; Xu, Z.W. ; Yang, Y.F. ; Tong, Z.R. ; Kai, G.Y. ; Dong, X.Y.
Pub. info.: Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China.  pp.441-444,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4920
10.

Conference Proceedings

Conference Proceedings
Zhou, Q. ; Lou, H.H. ; Huang, Y.L.
Pub. info.: Topical Conference on Batch Processing : presentation record of the topical conference held in conjunction with the American Institute of Chemical Engineers, 2001 annual meeting, November 5-9, 2001, Reno, NV.  pp.166-176,  2001.  New York.  American Institute of Chemical Engineers
Title of ser.: AIChE Conference Proceedings
Ser. no.: 149