Blank Cover Image

Applicability of white light scanning interferometry for high-resolution characterization of surface defects

Author(s):
Publication title:
Nondestructive Evaluation of Materials and Composites V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4336
Pub. Year:
2001
Page(from):
135
Page(to):
145
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819440228 [0819440221]
Language:
English
Call no.:
P63600/4336
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Characterization of epoxy coating degradation using NDE imaging techniques

Hoffmann, J., Kramb, V., Johnson, J., Meyendorf, N.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Applications of Scanning Defect Mapping System for Semiconductor Characterization

Carr, Kevin F., Carlson, N., Weitzman, P., Sopori, B. L., Marshall, C., Allen, L.

MRS - Materials Research Society
2 Conference Proceedings High resolution surface characterization using STM light emission techniques

Horn,J., Marx,N., Weiss,B.L., Hartnagel,H.L., Stehle,M., Bischoff,M., Pagnia,H.

Trans Tech Publications
8 Conference Proceedings Wide-scale surface characterization by combination of scanning force microscopy,white light interferometry,and light scattering

Gliech,S., Duparre,A., Recknagel,R.-J., Notni,G.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings Surface characterization of laser-ablated hard tissue: a comparison of scanning white-light interferometry and electron microscopy

B.J.F. Wong, D.E. Amato, L.-H.L. Liaw, M.W. Berns, J. Neev

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Scanning white-light interferometry for microstructures geometrical characterization

T. Guo, C. Hu, J. Chen, X. Fu, X. Hu

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Characterization of pitting corrosion damage through multiscale analysis

Frantziskonis,G.N., Simon,L.B., Woo,J., Matikas,T.E.

SPIE - The International Society for Optical Engineering
10 Conference Proceedings Slow-particle effect in coherent transient high-resolution spectroscopy

Vasilenko,L.S., Rubtsova,N.N., Hvorostov,E.B.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings High-resolution image intensifier development: preliminary results

J. Castracane, L.P. Clow, L.B. Boskma

Society of Photo-optical Instrumentation Engineers
11 Conference Proceedings Acoustic thermography using an uncooled high-speed camera and low-power ultrasonic excitation: test system and its application to impact flaw detection in CFRP …

Haupt, L., Zimmerhackl. M, Meyendorf, N, Kohler, B.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings High-resolution nondestructive evaluation at the Center for Materials Diagnosis

Meyendorf, N., Sathish, S., Druffner, C.J., Blackshire, J.L., Hoffmann, J.P., Zhan, Q., Andrews, R.J.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Instrumentation for speckle interferometry and techniques for investigating deformation and fracture

Zuev, L.B., Polyakov, S.N., Gorbatenko, V.V.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12