1.

Conference Proceedings
Conference Proceedings
1. Improved beam quality due to current profiling in a broad-area semiconductor laser
Houlihan, J.A. ; Voignier, V. ; O'Callaghan, J.R. ; Wu, G. ; Huyet, G. ; McInerney, J.G. ; Corbett, B.
Pub. info.: Laser Diodes, Optoelectronic Devices, and Heterogenous Integration.  pp.261-269,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4947
2.

Conference Proceedings
Conference Proceedings
2. Achieving spatial coherence in broad-area lasers using transverse-gain tailoring techniques
Houlihan, J.A. ; O'Callaghan, J.R. ; Voignier, V. ; Huyet, G. ; Mclnerney, J.G. ; Corbett, B.
Pub. info.: Novel In-Plane Semiconductor Lasers.  pp.250-255,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4651
3.

Conference Proceedings
Conference Proceedings
3. Lasing properties of semiconductor microcavity lasers
Wu, G.H. ; Houlihan, J.A. ; Huyet, G. ; Corbett, B. ; Lambkin, P.
Pub. info.: Opto-Ireland 2002: Optics and Photonics Technologies and Applications.  Part Two  pp.1076-1083,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4876
4.

Conference Proceedings
Conference Proceedings
4. Current profiling in broad-area semiconductor lasers
Voignier, V. ; Sailliot, C. ; Houlihan, J.A. ; O'Callaghan, J.R. ; Wu, G. ; Huyet, G. ; Mclnerney, J.G.
Pub. info.: Physics and Simulation of Optoelectronic Devices X.  pp.336-343,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4646