1.

Conference Proceedings
Conference Proceedings
1. Antiferroelectric liquid crystal on CMOS technology for microdisplays and microphotonics
Underwood,I. ; Vass,D.G. ; Newsam,M.I. ; Hossack,W.J. ; Bodammer,G.K.H. ; Nilsen,V.K. ; Stevenson,J.T.M. ; Gundlach,A.M. ; Parkes,W. ; Oton,J.M. ; Quintana,X. ; Chan,L.K.M. ; Bartelous,P. ; Flannigan,N. ; Swedenkrans,G. ; Waldelof,C. ; Rampin,M. ; Vindigni,A.
Pub. info.: Wave optics and VLSI photonic devices for information processing : 2-3 August 2001 San Diego, USA.  pp.196-205,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4435
2.

Conference Proceedings
Conference Proceedings
2. Microfabrication and packaging of deformable mirror devices
Ross,A.W.S. ; Graham,S.C. ; Gundlach,A.M. ; Stevenson,J.T.M. ; Hossack,W.J. ; Vass,D.G. ; Bodammer,G. ; Smith,E. ; Ward,K.
Pub. info.: Micro-opto-electro-mechanical systems : 22-23 May 2000, Glasgow, Scotland, United Kingdom.  pp.41-48,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4075
3.

Conference Proceedings
Conference Proceedings
3. Noise degradation and fault tolerance in annealed binary-phase hologram interconnections
Smith,P. ; Samus,S. ; Hossack,W.J. ; Vass,D.G.
Pub. info.: Second International Conference on Optical Information Processing.  pp.211-216,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2969
4.

Conference Proceedings
Conference Proceedings
4. Scanning probe microscope study of obliquely evaporated SiOx and its indium-tin-oxide underlayer for the alignment of ferroelectric liquid crystals
Bodammer,G. ; Gourlay,J. ; Vass,D.G. ; Hossack,W.J.
Pub. info.: International Liquid Crystal Workshop on Surface Phenomena.  pp.95-99,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2731