1.

Conference Proceedings
Conference Proceedings
1. Statistical Analysis of Micropipe Defect Distributions in Silicon Carbide Crystals
Elkington, Troy ; Emorhokpor, Ejiro ; Kerr, Tom ; Chen, John ; Essary, Kevin ; Golab, Mike ; Hopkins, Richard H.
Pub. info.: New applications for wide-bandgap semiconductors : symposium held April 22-24, 2003, San Francisco, California, U.S.A..  pp.177-182,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 764
2.

Technical Paper
Technical Paper
2. SiC high temperature electronics for next generation aircraft controls systems
Perkins, John F. ; Hopkins, Richard H. ; Brandt, Charles D. ; Agarwal, Anant K. ; Seshadri, Suresh ; Siergiej, Richard R.
Pub. info.: A.S.M.E. paper.  1996.  New York.  The American Society of Mechanical Engineers
Title of ser.: ASME Technical Paper : GT
Ser. no.: 1996